SPECTROMETRY OF LOW-ENERGY GAMMA- AND X-RAYS WITH GE(LI) DETECTORS

被引：17

作者：

DREXLER, G

PERZL, F

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS | 1967年 / 48卷 / 02期

关键词：

D O I：

10.1016/0029-554X(67)90337-0

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：332 / +

页数：1

相关论文

共 6 条

[1] APPLICATION OF HIGH-RESOLUTION SEMICONDUCTOR DETECTORS IN X-RAY EMISSION SPECTROGRAPHY
BOWMAN, HR
HYDE, EK
THOMPSON, SG
JARED, RC
[J]. SCIENCE, 1966, 151 (3710) : 562 - &
[2] HIGH-RESOLUTION X-RAY AND ELECTRON SPECTROMETER
ELAD, E
NAKAMURA, M
[J]. NUCLEAR INSTRUMENTS & METHODS, 1966, 41 (01): : 161 - +
[3] GLOS MB, 1966, NUCLEONICS, V24, P44
[4] SEMICONDUCTOR DETECTORS FOR NUCLEAR SPECTROMETRY
GOULDING, FS
[J]. NUCLEAR INSTRUMENTS & METHODS, 1966, 43 (01): : 1 - +
[5] RUGE J, 1966, KERNTECHNIK, V8, P297
[6] SEMICONDUCTOR LITHIUM-ION DRIFT DIODES AS HIGH-RESOLUTION GAMMA-RAY PAIR SPECTROMETERS
TAVENDALE, AJ
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1964, NS11 (03) : 191 - +