SYNCHROTRON-BASED IMAGING WITH A MAGNETIC PROJECTION PHOTOELECTRON MICROSCOPE

被引：11

作者：

KING, PL ^{[1
]}

BORG, A ^{[1
]}

KIM, C ^{[1
]}

YOSHIKAWA, SA ^{[1
]}

PIANETTA, P ^{[1
]}

LINDAU, I ^{[1
]}

机构：

[1] UNIV TRONDHEIM, N-7034 TRONDHEIM, NORWAY

来源：

ULTRAMICROSCOPY | 1991年 / 36卷 / 1-3期

关键词：

D O I：

10.1016/0304-3991(91)90143-T

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The magnetic projection photoelectron microscope performs imaging photoelectron and photoabsorption spectroscopy with a lateral resolution of the order of microns. We review practical experience accumulated in two months of synchrotron-based operations. Theoretical limitations and practical issues related to count rates, elemental and chemical contrast and extraneous noise are discussed. A comparison is made between our experience with retarding field analysis and a conceptual imaging band-pass analyzer. Recent observations from surface diffusion experiments are presented.

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页码：117 / 129

页数：13

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