RATE PREDICTION FOR SINGLE EVENT EFFECTS - A CRITIQUE

被引：204

作者：

PETERSEN, EL ^{[1
]}

PICKEL, JC ^{[1
]}

ADAMS, JH ^{[1
]}

SMITH, EC ^{[1
]}

机构：

[1] MAXWELL LABS INC,DIV S-CUBED,SAN DIEGO,CA 92121

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1992年 / 39卷 / 06期

关键词：

D O I：

10.1109/23.211340

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The prediction of single event rates depends upon the proper interpretation of ground test data and upon the way the data is used in the rate calculations. This work performs a critical review of various methods used for heavy ion predictions and recommends a standard approach.

引用

页码：1577 / 1599

页数：23

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[2]

ADAMS JH, 1986, NRL5901 MEM REP

[3]

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[4]

[Anonymous], COMMUNICATION, P2