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THICKNESS AND REFRACTIVE-INDEX DISPERSION MEASUREMENT IN A THIN-FILM USING THE HAIDINGER INTERFEROMETER

被引：8
作者：
DEOLIVEIRA, EA
FREJLICH, J
机构：
来源：
APPLIED OPTICS | 1989年 / 28卷 / 07期
关键词：
D O I：
10.1364/AO.28.001382
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：1382 / 1386
页数：5
相关论文
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