INTERACTION OF PD-OVERLAYERS WITH SNO2 - COMPARATIVE XPS, SIMS, AND SNMS STUDIES

被引：12

作者：

GEIGER, JF ^{[1
]}

BECKMANN, P ^{[1
]}

SCHIERBAUM, KD ^{[1
]}

GOPEL, W ^{[1
]}

机构：

[1] UNIV TUBINGEN,INST NAT WISSENSCH MED,W-7410 REUTLINGEN,GERMANY

来源：

FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY | 1991年 / 341卷 / 1-2期

关键词：

D O I：

10.1007/BF00322101

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

We report about interaction processes between palladium (Pd) and tin dioxide (SnO2) studied with various surface spectroscopic techniques. Total sputter yields necessary for absolute depth calibration in SIMS are determined for SnO2. Clustering of palladium occurs at low temperatures. Small changes in the XPS relative core level intensities of Pd and Sn allow to determine cluster sizes. Oxidation of Pd in the presence of oxygen at T greater-than-or-equal-to 470 K is a prerequisite for diffusion of Pd2+ ions into SnO2 layers. The latter process is confirmed and described quantitatively by evaluating the SIMS and SNMS measurements.

引用

页码：25 / 30

页数：6

共 12 条

[1] BARIN I, 1989, THERMODYNAMICAL PROP, P697
[2] BENNINGHOVEN A, 1987, SECONDARY ION MASS S, P213
[3] TRANSPARENT CONDUCTORS - A STATUS REVIEW
CHOPRA, KL
MAJOR, S
PANDYA, DK
[J]. THIN SOLID FILMS, 1983, 102 (01) : 1 - 46
[4] SURFACE SPECTROSCOPIC STUDIES ON PD-DOPED SNO2
GEIGER, JF
SCHIERBAUM, KD
GOPEL, W
[J]. VACUUM, 1990, 41 (7-9) : 1629 - 1632
[5] GOPEL W, 1987, P ECASIA 87 STUTTGAR
[6] GOPEL W, 1989, SENSOR ACTUATOR, V16, P187
[7] ELECTRONIC INTERACTION BETWEEN METAL ADDITIVES AND TIN DIOXIDE IN TIN DIOXIDE-BASED GAS SENSORS
MATSUSHIMA, S
TERAOKA, Y
MIURA, N
YAMAZOE, N
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1988, 27 (10): : 1798 - 1802
[8] MULLER KH, 1985, J VAC SCI TECHNOL A, V3, P1367, DOI 10.1116/1.572780
[9] RECENT APPLICATIONS OF SECONDARY NEUTRAL MASS-SPECTROMETRY FOR QUANTITATIVE-ANALYSIS OF HOMOGENEOUS AND STRUCTURED SAMPLES
OECHSNER, H
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1988, 33 (1-4) : 918 - 925
[10] DEFECT STRUCTURE AND SENSING MECHANISM OF SNO2 GAS SENSORS - COMPARATIVE ELECTRICAL AND SPECTROSCOPIC STUDIES
SCHIERBAUM, KD
WIEMHOFER, HD
GOPEL, W
[J]. SOLID STATE IONICS, 1988, 28 : 1631 - 1636

← 1 2 →