ELECTRON-CAPTURE CROSS-SECTION IN COPPER DOPED CDS

被引：6

作者：

GRIMMEISS, HG

JANZEN, E

KULLENDORFF, N

机构：

来源：

SOLID STATE COMMUNICATIONS | 1980年 / 35卷 / 09期

关键词：

D O I：

10.1016/0038-1098(80)90883-2

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：727 / 728

页数：2

共 13 条

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[5]

GRIMMEISS HG, UNPUBLISHED

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[9] DEEP-LEVEL TRANSIENT SPECTROSCOPY - NEW METHOD TO CHARACTERIZE TRAPS IN SEMICONDUCTORS [J].

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