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400-MBIT/S, 372-KM COHERENT TRANSMISSION EXPERIMENT USING IN-LINE OPTICAL AMPLIFIERS

被引：33
作者：
OLSSON, NA
OBERG, MG
KOSZI, LA
PRZYBYLEK, G
机构：
[1] AT&T Bell Lab, Murray Hill, NJ,, USA, AT&T Bell Lab, Murray Hill, NJ, USA
来源：
ELECTRONICS LETTERS | 1988年 / 24卷 / 01期
关键词：
D O I：
10.1049/el:19880025
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
11
引用
收藏
页码：36 / 38
页数：3
相关论文
共 11 条
  • [1] GAIN MEASUREMENTS OF INGAASP 1.5-MU-M OPTICAL AMPLIFIERS
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    [J]. ELECTRONICS LETTERS, 1985, 21 (23) : 1076 - 1177
  • [2] LINEWIDTH REQUIREMENT EVALUATION AND 290-KM TRANSMISSION EXPERIMENT FOR OPTICAL CPFSK DIFFERENTIAL DETECTION
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    [J]. ELECTRONICS LETTERS, 1986, 22 (15) : 791 - 792
  • [3] OPTICAL-SYSTEM WITH 2 PACKAGED 1.5-MU-M SEMICONDUCTOR-LASER AMPLIFIER REPEATERS
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    OMAHONY, MJ
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    [J]. ELECTRONICS LETTERS, 1986, 22 (05) : 253 - 255
  • [4] 5.2 DB NOISE-FIGURE IN A 1.5 MU-M INGAASP TRAVELING-WAVE LASER-AMPLIFIER
    MUKAI, T
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    [J]. ELECTRONICS LETTERS, 1987, 23 (05) : 216 - 218
  • [5] 313-KM TRANSMISSION EXPERIMENT AT 1-GBIT/S USING OPTICAL AMPLIFIERS AND A LOW CHIRP LASER
    OBERG, MG
    OLSSON, NA
    KOSZI, LA
    PRZYBYLEK, GJ
    [J]. ELECTRONICS LETTERS, 1988, 24 (01) : 38 - 39
  • [6] ASK HETERODYNE RECEIVER SENSITIVITY MEASUREMENTS WITH 2 IN-LINE 1.5-MU-M OPTICAL AMPLIFIERS
    OLSSON, NA
    [J]. ELECTRONICS LETTERS, 1985, 21 (23) : 1085 - 1087
  • [7] OLSSON NA, 1987, OFC IOOC 87, P32
  • [8] GAIN, POLARIZATION SENSITIVITY AND SATURATION POWER OF 1.5-MU-M NEAR-TRAVELING-WAVE SEMICONDUCTOR-LASER AMPLIFIER
    SIMON, JC
    LANDOUSIES, B
    BOSSIS, Y
    DOUSSIERE, P
    FERNIER, B
    PADIOLEAU, C
    [J]. ELECTRONICS LETTERS, 1987, 23 (07) : 332 - 334
  • [9] 100 MBIT/S PSK HETERODYNE EXPERIMENT USING A TRAVELING-WAVE LASER-AMPLIFIER
    STEELE, RC
    MARSHALL, IW
    [J]. ELECTRONICS LETTERS, 1987, 23 (06) : 296 - 297
  • [10] CHANNELED-SUBSTRATE BURIED-HETEROSTRUCTURE INGAASP/INP LASER WITH SEMIINSULATING OMVPE BASE STRUCTURE AND LPE REGROWTH
    WILT, DP
    LONG, J
    DAUTREMONTSMITH, WC
    FOCHT, MW
    SHEN, TM
    HARTMAN, RL
    [J]. ELECTRONICS LETTERS, 1986, 22 (16) : 869 - 870
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