QUANTITATIVE SURFACE-ANALYSIS BY XPS AND XAS

被引：19

作者：

EBEL, H

EBEL, MF

KROCZA, H

机构：

来源：

SURFACE AND INTERFACE ANALYSIS | 1988年 / 12卷 / 1-12期

关键词：

D O I：

10.1002/sia.740120214

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

收藏

页码：137 / 143

页数：7

相关论文

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