COMPACT SCANNING-FORCE MICROSCOPE USING A LASER DIODE

被引：59

作者：

SARID, D ^{[1
]}

IAMS, D ^{[1
]}

WEISSENBERGER, V ^{[1
]}

BELL, LS ^{[1
]}

机构：

[1] UNIV ARIZONA,LUNAR & PLANETARY LAB,TUCSON,AZ 85721

来源：

关键词：

D O I：

10.1364/OL.13.001057

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：1057 / 1059

页数：3

共 14 条

[1] ATOMIC FORCE MICROSCOPE
BINNIG, G
QUATE, CF
GERBER, C
[J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933
[2] ATOMIC FORCE MICROSCOPY USING OPTICAL INTERFEROMETRY
ERLANDSSON, R
MCCLELLAND, GM
MATE, CM
CHIANG, S
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02): : 266 - 270
[3] GRUTTER P, 1988, J VAC SCI TECHNOL A, V6, P279, DOI 10.1116/1.575425
[4] MAMIN HJ, IN PRESS APPL PHYS L
[5] HIGH-RESOLUTION MAGNETIC IMAGING OF DOMAINS IN TBFE BY FORCE MICROSCOPY
MARTIN, Y
RUGAR, D
WICKRAMASINGHE, HK
[J]. APPLIED PHYSICS LETTERS, 1988, 52 (03) : 244 - 246
[6] HIGH-RESOLUTION CAPACITANCE MEASUREMENT AND POTENTIOMETRY BY FORCE MICROSCOPY
MARTIN, Y
ABRAHAM, DW
WICKRAMASINGHE, HK
[J]. APPLIED PHYSICS LETTERS, 1988, 52 (13) : 1103 - 1105
[7] MAGNETIC IMAGING BY FORCE MICROSCOPY WITH 1000-A RESOLUTION
MARTIN, Y
WICKRAMASINGHE, HK
[J]. APPLIED PHYSICS LETTERS, 1987, 50 (20) : 1455 - 1457
[8] ATOMIC FORCE MICROSCOPE FORCE MAPPING AND PROFILING ON A SUB 100-A SCALE
MARTIN, Y
WILLIAMS, CC
WICKRAMASINGHE, HK
[J]. JOURNAL OF APPLIED PHYSICS, 1987, 61 (10) : 4723 - 4729
[9] RUGAR D, IN PRESS REV SCI INS
[10] OBSERVATION OF MAGNETIC FORCES BY THE ATOMIC FORCE MICROSCOPE
SAENZ, JJ
GARCIA, N
GRUTTER, P
MEYER, E
HEINZELMANN, H
WIESENDANGER, R
ROSENTHALER, L
HIDBER, HR
GUNTERODT, HJ
[J]. JOURNAL OF APPLIED PHYSICS, 1987, 62 (10) : 4293 - 4295