IMPROVING THE ACCURACY OF DETERMINATION OF LINE ENERGIES BY ESCA - CHEMICAL-STATE PLOTS FOR SILICON ALUMINUM COMPOUNDS

被引：130

作者：

WAGNER, CD

SIX, HA

JANSEN, WT

TAYLOR, JA

机构：

[1] PERKIN ELMER CORP,DIV PHYS ELECTR,MT VIEW,CA 94043

[2] PERKIN ELMER CORP,DIV PHYS ELECTR,EDEN PRAIRIE,MN 55344

来源：

APPLIED SURFACE SCIENCE | 1981年 / 9卷 / 1-4期

关键词：

D O I：

10.1016/0378-5963(81)90037-4

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：203 / 213

页数：11

共 12 条

[1] ENERGY CALIBRATION IN ELECTRON-SPECTROSCOPY AND THE RE-DETERMINATION OF SOME REFERENCE ELECTRON-BINDING ENERGIES
BIRD, RJ
SWIFT, P
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1980, 21 (03) : 227 - 240
[2] BREMSSTRAHLUNG-INDUCED AUGER PEAKS
CASTLE, JE
WEST, RH
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1980, 18 (04) : 355 - 358
[3] CASTLE JE, 1980, J ELECTRON SPECTROSC, V20, P83
[4] ELECTRON ESCAPE DEPTH IN SILICON
KLASSON, M
BERNDTSSON, A
HEDMAN, J
NILSSON, R
NYHOLM, R
NORDLING, C
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 3 (06) : 427 - 434
[5] SURFACE CHARACTERIZATION OF CATALYSTS USING ELECTRON SPECTROSCOPIES - RESULTS OF A ROUND-ROBIN SPONSORED BY ASTM-COMMITTEE D-32 ON CATALYSTS
MADEY, TE
WAGNER, CD
JOSHI, A
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1977, 10 (04) : 359 - 388
[6] REACTION OF N2-(+) BEAMS WITH ALUMINUM SURFACES
TAYLOR, JA
RABALAIS, JW
[J]. JOURNAL OF CHEMICAL PHYSICS, 1981, 75 (04) : 1735 - 1745
[7] FURTHER EXAMINATION OF THE SI KLL AUGER LINE IN SILICON-NITRIDE THIN-FILMS
TAYLOR, JA
[J]. APPLIED SURFACE SCIENCE, 1981, 7 (1-2) : 168 - 184
[8] Wagner C., 1979, HDB XRAY PHOTOELECTR
[9] X-RAY PHOTOELECTRON-SPECTROSCOPY WITH X-RAY PHOTONS OF HIGHER ENERGY
WAGNER, CD
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (02): : 518 - 523
[10] GENERATION OF XPS AUGER LINES BY BREMSSTRAHLUNG
WAGNER, CD
TAYLOR, JA
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1980, 20 (1-2) : 83 - 93

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