ELECTRON-SPIN-RESONANCE MEASUREMENTS OF SPIN SUSCEPTIBILITY OF HEAVILY DOPED TYPE SILICON

被引：46

作者：

QUIRT, JD

MARKO, JR

机构：

来源：

PHYSICAL REVIEW LETTERS | 1971年 / 26卷 / 06期

关键词：

D O I：

10.1103/PhysRevLett.26.318

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

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页码：318 / &

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