机构:
CHALMERS UNIV TECHNOL,ELECTR RES LAB,S-40220 GOTHENBURG 5,SWEDENCHALMERS UNIV TECHNOL,ELECTR RES LAB,S-40220 GOTHENBURG 5,SWEDEN
NILSSON, PO
[1
]
SHIVARAMAN, MS
论文数: 0引用数: 0
h-index: 0
机构:
CHALMERS UNIV TECHNOL,ELECTR RES LAB,S-40220 GOTHENBURG 5,SWEDENCHALMERS UNIV TECHNOL,ELECTR RES LAB,S-40220 GOTHENBURG 5,SWEDEN
SHIVARAMAN, MS
[1
]
机构:
[1] CHALMERS UNIV TECHNOL,ELECTR RES LAB,S-40220 GOTHENBURG 5,SWEDEN
来源:
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS
|
1979年
/
12卷
/
07期
关键词:
D O I:
10.1088/0022-3719/12/7/030
中图分类号:
O469 [凝聚态物理学];
学科分类号:
070205 ;
摘要:
The optical transmittance of thin PdO films has been measured in the range 0.5-5.4 eV. From these data the optical constants have been determined by Kramers-Kronig analysis. A small band gap (0.8 eV) and a high dielectric constant (8.0) have been found.
引用
收藏
页码:1423 / 1427
页数:5
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Philipp HR, 1967, SEMICOND SEMIMETALS, V3, P93, DOI [10.1016/S0080-8784(08)60316-6, DOI 10.1016/S0080-8784(08)60316-6]