QUANTITATIVE X-RAY-EMISSION FROM A DPF DEVICE

被引:41
作者
BURKHALTER, PG [1 ]
MEHLMAN, G [1 ]
NEWMAN, DA [1 ]
KRISHNAN, M [1 ]
PRASAD, RR [1 ]
机构
[1] SCI RES LAB INC,ALAMEDA,CA 94501
关键词
D O I
10.1063/1.1143489
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The x-ray emission was measured from a Dense Plasma Focus (DPF) device. The high density plasma is generated by an electrical discharge in rarefied-neon gas between electrodes in a Mather-type plasma focus configuration. A curved-crystal x-ray spectrograph, a pinhole camera, and an active-filtered photodiode were the diagnostics viewing the axial output of the pinched-plasma region. The x-ray pinhole images indicate a pinched volume roughly 8 mm in length with a nearly circular cross section of about 300 mum in diameter. The digitized spectral traces were computer processed to obtain absolute x-ray line intensities. The neon plasma yielded 10-15 J of K-shell radiation into 4pi with the hydrogenlike and heliumlike alpha lines totaling 55%-65% of the total spectral emission. The x-ray emission of the DPF device was studied as a function of discharge current and anode diameter.
引用
收藏
页码:5052 / 5055
页数:4
相关论文
共 14 条
[1]  
BOURGADE JL, 1986, REV SCI INSTRUM, V57, P1265
[2]   DIFFRACTION EFFICIENCY OF THE CURVED-CRYSTAL SPECTROGRAPH [J].
BROWN, DB ;
FATEMI, M .
JOURNAL OF APPLIED PHYSICS, 1980, 51 (05) :2540-2548
[4]   SATELLITE LINE SPECTRA FROM LASER-PRODUCED PLASMAS [J].
FELDMAN, U ;
DOSCHEK, GA ;
NAGEL, DJ ;
COWAN, RD ;
WHITLOCK, RR .
ASTROPHYSICAL JOURNAL, 1974, 192 (01) :213-220
[5]  
HENKE BL, 1985, REV SCI INSTRUM, V56, P1551
[6]   PLASMA-FOCUS X-RAY SOURCE FOR LITHOGRAPHY [J].
KATO, Y ;
OCHIAI, I ;
WATANABE, Y ;
MURAYAMA, S .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1988, 6 (01) :195-198
[7]  
KELLY RL, 1973, NRL7599 REP
[8]  
Mather J W., 1971, PLASMA PHYS B, V9, P187, DOI DOI 10.1016/S0076-695X(08)60862-5
[9]  
RICHTER F, 1989, AIP CONF PROC, V195, P515
[10]   X-RAY-CALIBRATION OF KODAK DIRECT EXPOSURE FILM [J].
ROCKETT, PD ;
BIRD, CR ;
HAILEY, CJ ;
SULLIVAN, D ;
BROWN, DB ;
BURKHALTER, PG .
APPLIED OPTICS, 1985, 24 (16) :2536-2542