CORRECTED ELECTROSTATIC LENS SYSTEMS FOR ION-BEAMS

被引：10

作者：

DALGLISH, RL

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1981年 / 191卷 / 1-3期

关键词：

D O I：

10.1016/0029-554X(81)91004-1

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：191 / 198

页数：8

共 10 条

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GABOR, D .

[3] THE FOCUSING OF GEV PARTICLES WITH ELECTROSTATIC COAXIAL LENSES [J].

KREJCIK, P .

NUCLEAR INSTRUMENTS & METHODS, 1980, 171 (02) :233-236

[4] NEW ELECTROSTATIC ION MICROPROBE SYSTEM [J].

KREJCIK, P ;

KELLY, JC ;

DALGLISH, RL .

NUCLEAR INSTRUMENTS & METHODS, 1980, 168 (1-3) :247-249

[5]

KREJCIK P, 1979, J PHYS D APPL PHYS, V12, P161, DOI 10.1088/0022-3727/12/2/003

[6]

KREJCIK P, 1980, OPTIK, V4, P385

[7]

KREJCIK P, 1980, THESIS U NSW

[8]

KREJCIK P, 1976, P AUST C NUCL TECHS, P101

[9]

LIEBL H, 1979, OPTIK, V53, P333

MAGGIORE, CJ .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1981, 191 (1-3) :199-203