RELATION BETWEEN NORMAL-STATE AND SUPERCONDUCTIVE PROPERTIES OF NIOBIUM SPUTTERED FILMS

被引：31

作者：

ANDREONE, A ^{[1
]}

CASSINESE, A ^{[1
]}

IAVARONE, M ^{[1
]}

VAGLIO, R ^{[1
]}

KULIK, II ^{[1
]}

PALMIERI, V ^{[1
]}

机构：

[1] IST NAZL FIS NUCL, LAB NAZL LEGNARO, I-35100 LEGNARO, ITALY

来源：

PHYSICAL REVIEW B | 1995年 / 52卷 / 06期

关键词：

D O I：

10.1103/PhysRevB.52.4473

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Data on niobium sputtered films obtained by different techniques are presented and discussed. The residual resistivity is shown to be determined by grain boundary scattering. It is then proven that, also in this case, the residual resistivity behaves as a ''universal'' parameter determining the detailed superconducting properties of the films. The effect of film nonuniformity in the growth direction is also discussed.

引用

页码：4473 / 4476

页数：4

共 24 条

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