STRUCTURAL VARIATION IN AMORPHOUS GE

被引:5
作者
RUDEE, ML [1 ]
机构
[1] RICE UNIV,MAT SCI GRP,HOUSTON,TX 77001
来源
PHILOSOPHICAL MAGAZINE | 1973年 / 28卷 / 05期
关键词
D O I
10.1080/14786437308220974
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:1149 / 1151
页数:3
相关论文
共 7 条
[1]   ANISOTROPIC MICROSTRUCTURE IN EVAPORATED AMORPHOUS GERMANIUM FILMS [J].
CARGILL, GS .
PHYSICAL REVIEW LETTERS, 1972, 28 (21) :1372-&
[2]   HIGH-RESOLUTION ELECTRON MICROSCOPE OBSERVATION OF VOIDS IN AMORPHOUS GE [J].
DONOVAN, TM ;
HEINEMAN.K .
PHYSICAL REVIEW LETTERS, 1971, 27 (26) :1794-&
[3]  
GRACZYK JF, IN PRESS
[4]   ELECTRICAL AND STRUCTURAL-PROPERTIES OF AMORPHOUS GERMANIUM [J].
HAUSER, JJ ;
STAUDINGER, A .
PHYSICAL REVIEW B, 1973, 8 (02) :607-615
[5]   DEPENDENCE OF STRUCTURE OF AMORPHOUS GERMANIUM FILMS ON ANGLE OF EVAPORATION [J].
ORLOWSKI, BA ;
SPICER, WE .
MATERIALS RESEARCH BULLETIN, 1972, 7 (08) :793-&
[6]   ELECTRONIC-STRUCTURE OF AMORPHOUS SI FROM PHOTOEMISSION AND OPTICAL STUDIES [J].
PIERCE, DT ;
SPICER, WE .
PHYSICAL REVIEW B, 1972, 5 (08) :3017-&
[7]  
[No title captured]