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NEW METHODS OF MEASURING CAPACITANCE AND RESISTANCE OF VERY HIGH LOSS MATERIALS AT HIGH-FREQUENCIES
被引:11
作者
:
MASUDA, Y
论文数:
0
引用数:
0
h-index:
0
机构:
HAMAMATSU HYG COLL,HAMAMATSU,JAPAN
HAMAMATSU HYG COLL,HAMAMATSU,JAPAN
MASUDA, Y
[
1
]
NISHIKAWA, M
论文数:
0
引用数:
0
h-index:
0
机构:
HAMAMATSU HYG COLL,HAMAMATSU,JAPAN
HAMAMATSU HYG COLL,HAMAMATSU,JAPAN
NISHIKAWA, M
[
1
]
ICHIJO, B
论文数:
0
引用数:
0
h-index:
0
机构:
HAMAMATSU HYG COLL,HAMAMATSU,JAPAN
HAMAMATSU HYG COLL,HAMAMATSU,JAPAN
ICHIJO, B
[
1
]
机构
:
[1]
HAMAMATSU HYG COLL,HAMAMATSU,JAPAN
来源
:
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
|
1980年
/ 29卷
/ 01期
关键词
:
D O I
:
10.1109/TIM.1980.4314857
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:28 / 36
页数:9
相关论文
共 4 条
[1]
DIFFERENTIAL CAPACITOR CIRCUIT FOR VERY HIGH AND LOW DIELECTRIC Q-FACTOR MEASUREMENT AT HIGH-FREQUENCIES
[J].
ICHIJO, B
论文数:
0
引用数:
0
h-index:
0
机构:
SHIZUOKA UNIV,HAMAMATSU,JAPAN
ICHIJO, B
;
MASUDA, Y
论文数:
0
引用数:
0
h-index:
0
机构:
SHIZUOKA UNIV,HAMAMATSU,JAPAN
MASUDA, Y
;
ABE, K
论文数:
0
引用数:
0
h-index:
0
机构:
SHIZUOKA UNIV,HAMAMATSU,JAPAN
ABE, K
.
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
1973,
IM22
(04)
:315
-319
[2]
A NEW METHOD OF MEASURING DIELECTRIC PROPERTY OF VERY-HIGH-LOSS MATERIALS AT HIGH FREQUENCIES
[J].
ICHIJO, B
论文数:
0
引用数:
0
h-index:
0
ICHIJO, B
;
ARAI, T
论文数:
0
引用数:
0
h-index:
0
ARAI, T
.
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
1970,
IM19
(01)
:73
-&
[3]
ON THE NEW METHOD OF MEASURING DIELECTRIC CONSTANT AND LOSS ANGLES OF SEMICONDUCTORS
[J].
ICHIJO, B
论文数:
0
引用数:
0
h-index:
0
ICHIJO, B
.
JOURNAL OF APPLIED PHYSICS,
1953,
24
(03)
:307
-311
[4]
ICHIJO B, 1954, J I ELECT ENG LOND, V74, P263
←
1
→
共 4 条
[1]
DIFFERENTIAL CAPACITOR CIRCUIT FOR VERY HIGH AND LOW DIELECTRIC Q-FACTOR MEASUREMENT AT HIGH-FREQUENCIES
[J].
ICHIJO, B
论文数:
0
引用数:
0
h-index:
0
机构:
SHIZUOKA UNIV,HAMAMATSU,JAPAN
ICHIJO, B
;
MASUDA, Y
论文数:
0
引用数:
0
h-index:
0
机构:
SHIZUOKA UNIV,HAMAMATSU,JAPAN
MASUDA, Y
;
ABE, K
论文数:
0
引用数:
0
h-index:
0
机构:
SHIZUOKA UNIV,HAMAMATSU,JAPAN
ABE, K
.
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
1973,
IM22
(04)
:315
-319
[2]
A NEW METHOD OF MEASURING DIELECTRIC PROPERTY OF VERY-HIGH-LOSS MATERIALS AT HIGH FREQUENCIES
[J].
ICHIJO, B
论文数:
0
引用数:
0
h-index:
0
ICHIJO, B
;
ARAI, T
论文数:
0
引用数:
0
h-index:
0
ARAI, T
.
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
1970,
IM19
(01)
:73
-&
[3]
ON THE NEW METHOD OF MEASURING DIELECTRIC CONSTANT AND LOSS ANGLES OF SEMICONDUCTORS
[J].
ICHIJO, B
论文数:
0
引用数:
0
h-index:
0
ICHIJO, B
.
JOURNAL OF APPLIED PHYSICS,
1953,
24
(03)
:307
-311
[4]
ICHIJO B, 1954, J I ELECT ENG LOND, V74, P263
←
1
→