ORIENTATIONAL EPITAXY OF HIGH-QUALITY C-60 FILMS ON AG(111)

被引:20
作者
FARTASH, A [1 ]
机构
[1] UNIV HOUSTON, TEXAS CTR SUPERCOND, HOUSTON, TX 77204 USA
来源
PHYSICAL REVIEW B | 1995年 / 52卷 / 11期
关键词
D O I
10.1103/PhysRevB.52.7883
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
C-60 structures grow in two distinct in-plane orientations on Ag(111) substrates as determined by their x-ray-diffraction scans. These structures consist of twinned (first-order) commensurate structures growing in high-symmetry, almost perfectly lattice-matched orientations (2 root 3X2 root 3+/-R30 degrees substrate unit cells), and structures whose close-packed directions are oriented in lower-symmetry in-plane orientations. These latter structures can be lattice matched to their substrates over larger unit cells than those of the commensurate structures. X-ray-diffraction scans show that their in-plane ($($) over bar$$ 220) mosaic peaks form double-positioning peaks with respect to [$($) over bar$$ 220] directions of the twinned commensurate structures that lie between them. Increasing the growth temperature, the close-packed directions of these double-positioning structures grow preferentially in orientations that converge toward the close-packed directions of the twinned commensurate structures.
引用
收藏
页码:7883 / 7886
页数:4
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