GROWTH AND MICROSTRUCTURE OF INTERFACIALLY ORIENTED LARGE-CRYSTALLINE-GRAIN C-60 SHEETS

被引:24
作者
FARTASH, A [1 ]
机构
[1] UNIV HOUSTON,DEPT PHYS,HOUSTON,TX 77204
关键词
D O I
10.1063/1.111785
中图分类号
O59 [应用物理学];
学科分类号
摘要
C60 films reaching sheet thicknesses of approximately 10 mum have been grown in vacuum by using a custom-built effusion cell generating a beam of C60 molecules at flux rates several times higher than rates achieved by conventional methods. High quality films are grown epitaxially on Muscovite 2M1 mica substrates with double domain structures. X-ray diffraction measurements show that in the [111] direction, the structural coherency of the films reaches approximately 5000 angstrom. Since with increasing thickness the mosaic structures of the films do not disorder significantly, the film grains remain well oriented away from the interface.
引用
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页码:1877 / 1879
页数:3
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