REMOVAL AND SCATTERING OF CHARGE-CARRIERS BY DEFECT CLUSTERS IN SEMICONDUCTORS

被引:6
作者
KOLCHENKO, TI
LOMAKO, VM
机构
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1978年 / 48卷 / 01期
关键词
D O I
10.1002/pssa.2210480136
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
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页码:263 / 269
页数:7
相关论文
共 21 条
[1]  
AKILOV YZ, 1972, RAD EFFECTS SEMICOND
[2]   RADIATION EFFECTS IN GAAS [J].
AUKERMAN, LW ;
GRAFT, RD ;
DAVIS, PW ;
SHILLIDAY, TS .
JOURNAL OF APPLIED PHYSICS, 1963, 34 (12) :3590-+
[4]   OPTICAL AND ELECTRICAL EFFECTS OF HIGH-CONCENTRATIONS OF DEFECTS IN IRRADIATED CRYSTALLINE GALLIUM-ARSENIDE [J].
COATES, R ;
MITCHELL, EWJ .
ADVANCES IN PHYSICS, 1975, 24 (05) :593-644
[5]  
CRAWFORD JH, 1959, J APPL PHYS, V30, P1204, DOI 10.1063/1.1735294
[6]   DISORDERED REGIONS IN SEMICONDUCTORS BOMBARDED BY FAST NEUTRONS [J].
GOSSICK, BR .
JOURNAL OF APPLIED PHYSICS, 1959, 30 (08) :1214-1218
[7]   CARRIER REMOVAL IN NEUTRON IRRADIATED SILICON [J].
HOLMES, RR .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1970, NS17 (06) :137-+
[8]  
KOLCHENKO TI, 1975, FIZ TEKH POLUPROV, V9, P1759
[9]  
KOLCHENKO TI, UNPUBLISHED
[10]  
KONOPLEVA RF, 1970, PECULIARITIES RAD DA