FRACTALS IN ANNEALED GE-AU AU BILAYER FILMS

被引：19

作者：

BA, L

ZEN, JL

ZHANG, SY

WU, ZQ

机构：

[1] Fundamental Physics Center, Structure Research Laboratory, University of Science and Technology of China

来源：

JOURNAL OF APPLIED PHYSICS | 1995年 / 77卷 / 02期

关键词：

D O I：

10.1063/1.359042

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Ge-22 at. %Au/Au bilayer films annealed at various temperatures have been observed by transmission electron microscopy. The as-deposited bilayer film is composed of crystalline Ge,Au and metastable Ge0.4Au0.6 phases. The Au grain size is nonuniform, and no amorphous Ge is observed. During annealing at 60-350°C, patterns with several wide branches are generated that are different from the dense branching fractals induced by crystallization of amorphous Ge in a-Ge/Au films. The fractal dimension of the pattern (measured by the box-counting method) increases with the annealing temperature. The agglomeration of small Au grains to coarse Au grains in the Ge-Au/Au bilayer film may be the mechanism for the fractal structure formation. © 1995 American Institute of Physics.

引用

页码：587 / 590

页数：4

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