MONITORING THE GROWTH OF AN OXIDE FILM ON ALUMINUM INSITU WITH THE QUARTZ CRYSTAL MICROBALANCE

被引：26

作者：

DEAKIN, MR ^{[1
]}

MELROY, OR ^{[1
]}

机构：

[1] IBM CORP,ALMADEN RES CTR,DIV RES,SAN JOSE,CA 95120

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1989年 / 136卷 / 02期

关键词：

D O I：

10.1149/1.2096633

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

页码：349 / 352

页数：4

共 18 条

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