A DIAGNOSTIC STUDY OF THE FIELD-EMISSION CHARACTERISTICS OF INDIVIDUAL MICRO-EMITTERS IN CVD DIAMOND FILMS

被引：74

作者：

XU, NS ^{[1
]}

TZENG, Y ^{[1
]}

LATHAM, RV ^{[1
]}

机构：

[1] AUBURN UNIV,DEPT ELECT ENGN,AUBURN,AL 36849

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1994年 / 27卷 / 09期

关键词：

D O I：

10.1088/0022-3727/27/9/027

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Details are given of an experimental study of the characteristics of field-induced electron emission from 15 mm diameter CVD diamond films deposited on an Mo substrate. Three dedicated techniques have been used to characterize the electron emission process: (i) the 'transparent anode imaging' technique for recording the spatial distributions of emission sites and the total current-voltage (I-V) characteristic, (ii) the 'anode probe hole' technique for measuring the I-V characteristic of individual sites, and (iii) 'field emission electron spectroscopy' for studying the energy distribution of emitted electrons. Finally, the physical implications of the findings from the electron energy spectroscopy measurement are discussed.

引用

页码：1988 / 1991

页数：4

共 9 条

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XU, NS
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XU, NS
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XU, NS
LATHAM, RV
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[9] XU NX, IN PRESS DIAMOND FIL

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