A CRITICAL EXAMINATION OF COMPUTER PROGRAMS USED IN QUANTITATIVE ELECTRON MICROPROBE ANALYSIS

被引：62

作者：

BEAMAN, DR

ISASI, JA

机构：

来源：

ANALYTICAL CHEMISTRY | 1970年 / 42卷 / 13期

关键词：

D O I：

10.1021/ac60295a021

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

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页码：1540 / +

页数：1

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[1] X-RAY SPECTROMETER PERFORMANCE AS A FUNCTION OF ELECTRON PROBE GEOMETRY
ABELMANN, RA
JONES, R
[J]. JOURNAL OF APPLIED PHYSICS, 1966, 37 (12) : 4507 - &
[2] AN EVALUATION OF ABSORPTION CORRECTION FUNCTIONS FOR ELECTRON PROBE MICROANALYSIS
ANDERSEN, CA
WITTRY, DB
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1968, 1 (05) : 529 - &
[3] [Anonymous], ELECT MICROPROBE
[4] BEAMAN DR, 1969, MIKROCHIM ACTA, P117
[5] EVALUATION OF CORRECTION PROCEDURES USED IN ELECTRON PROBE MICROANALYSIS WITH EMPHASIS ON ATOMIC NUMBER INTERVAL 13 TO 33
BEAMAN, DR
[J]. ANALYTICAL CHEMISTRY, 1967, 39 (04) : 418 - &
[6] BEAMAN DR, 1969, 4 P NATL C EL MICR A
[7] BEAMAN DR, 1968, 3 T NATL C EL MICR A
[8] BEESON MH, 1969, OPEN FILE REPORT US
[9] BELK JA, 1966, XRAY OPTICS MICROANA, P214
[10] EMPIRICAL CORRECTION FACTORS FOR ELECTRON MICROANALYSIS OF SILICATES AND OXIDES
BENCE, AE
ALBEE, AL
[J]. JOURNAL OF GEOLOGY, 1968, 76 (04) : 382 - &

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