COATING, MECHANICAL CONSTRAINTS, AND PRESSURE EFFECTS ON ELECTROMIGRATION

[1] ELECTROMIGRATION DAMAGE IN ALUMINUM FILM CONDUCTORS [J]. JOURNAL OF APPLIED PHYSICS, 1970, 41 (06) : 2381 - +

[2] BEYELER M, 1970, MEM ETUD SCI REV MET, V67, P395

[3] BEYELER M, 1965, PHYSICS SOLIDS HIGH, P367

[4] BLACK JR, 1969, IEEE T ELECTRON DEVI, VED16, P338

[5] ELECTROMIGRATION-INDUCED FAILURES IN ALUMINUM FILM CONDUCTORS [J]. APPLIED PHYSICS LETTERS, 1970, 17 (07) : 281 - &

[6] D'Heurle F., 1970, Applied Physics Letters, V16, P80, DOI 10.1063/1.1653108

[7] EMERICK RM, 1961, PHYS REV, V122, P1720

[8] NUCLEAR-MAGNETIC-RESONANCE DETERMINATION OF ACTIVATION VOLUME FOR SELF-DIFFUSION IN ALUMINUM [J]. PHYSICAL REVIEW B-SOLID STATE, 1971, 3 (08): : 2391 - &

[9] LEARN AJ, 1971, 9 P ANN IEEE REL PHY, P129

[10] CURRENT-INDUCED MASS TRANSPORT IN ALUMINUM [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1964, 25 (03) : 335 - &

[1] ELECTROMIGRATION DAMAGE IN ALUMINUM FILM CONDUCTORS [J]. JOURNAL OF APPLIED PHYSICS, 1970, 41 (06) : 2381 - +

[2] BEYELER M, 1970, MEM ETUD SCI REV MET, V67, P395

[3] BEYELER M, 1965, PHYSICS SOLIDS HIGH, P367

[4] BLACK JR, 1969, IEEE T ELECTRON DEVI, VED16, P338

[5] ELECTROMIGRATION-INDUCED FAILURES IN ALUMINUM FILM CONDUCTORS [J]. APPLIED PHYSICS LETTERS, 1970, 17 (07) : 281 - &

[6] D'Heurle F., 1970, Applied Physics Letters, V16, P80, DOI 10.1063/1.1653108

[7] EMERICK RM, 1961, PHYS REV, V122, P1720

[8] NUCLEAR-MAGNETIC-RESONANCE DETERMINATION OF ACTIVATION VOLUME FOR SELF-DIFFUSION IN ALUMINUM [J]. PHYSICAL REVIEW B-SOLID STATE, 1971, 3 (08): : 2391 - &

[9] LEARN AJ, 1971, 9 P ANN IEEE REL PHY, P129

[10] CURRENT-INDUCED MASS TRANSPORT IN ALUMINUM [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1964, 25 (03) : 335 - &