LOW-ENERGY ION-SCATTERING AT SURFACES

被引:511
作者
NIEHUS, H
HEILAND, W
TAGLAUER, E
机构
[1] UNIV OSNABRUCK, FACHBEREICH PHYS, W-4500 OSNABRUCK, GERMANY
[2] MAX PLANCK INST PLASMA PHYS, EURATOM ASSOC, W-8046 GARCHING, GERMANY
关键词
D O I
10.1016/0167-5729(93)90024-J
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The field of low-energy ion scattering for surface interactions at metals, alloys, catalysts and semiconductors is reviewed. The description of experimental set-up's for ion and neutral detection has been included. One of the topics is ion scattering for elemental analysis of the topmost layer to be performed in the classical noble-gas ion scattering spectroscopy approach (ISS) as well as with direct recoil spectroscopy (DRS). Emphasis has also been put on surface structure analysis including ion beam crystallography with low-energy ion backscattering (ICISS) for single-crystal surfaces. The basic principles, classical scattering theory, the effect of shadowing and blocking, and some of the computer simulation programs are briefly described. A discussion for understanding the physics of ion-surface interactions, charge exchange of various projectiles during collisions, molecule scattering and bond breaking is also included.
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页码:213 / 303
页数:91
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