SIMPLIFIED APPROACH TO NOISE IN MICROWAVE TRANSISTORS

[1] AGOURIDIS DG, 1965, THESIS U MINNESOTA

[2] BAELDE A, 1964, THESIS TU DELFT

[3] CHAMPLIN KS, 1960, T I RADIO ENGRS, VED 7, P29

[4] CHENETTE ER, 1960, P IRE, V48, P111

[5] COOKE HF, 1966, S FLUCTUATIONS SOLID

[6] COOKE HF, 1963, SOLID ST DESIGN, V4

[7] NOISE MEASURE OF MICROWAVE TRANSISTORS [J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (09): : 1204 - &

[8] FUKUI H, 1966, T IEEE ELECTRON DEVI, VED13, P329

[9] FUKUI H, 1966, T IEEE, VCT13, P137

[10] THEORY AND EXPERIMENTS ON SHOT NOISE IN SEMICONDUCTOR JUNCTION DIODES AND TRANSISTORS [J]. PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1957, 45 (06): : 839 - 854

[1] AGOURIDIS DG, 1965, THESIS U MINNESOTA

[2] BAELDE A, 1964, THESIS TU DELFT

[3] CHAMPLIN KS, 1960, T I RADIO ENGRS, VED 7, P29

[4] CHENETTE ER, 1960, P IRE, V48, P111

[5] COOKE HF, 1966, S FLUCTUATIONS SOLID

[6] COOKE HF, 1963, SOLID ST DESIGN, V4

[7] NOISE MEASURE OF MICROWAVE TRANSISTORS [J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (09): : 1204 - &

[8] FUKUI H, 1966, T IEEE ELECTRON DEVI, VED13, P329

[9] FUKUI H, 1966, T IEEE, VCT13, P137

[10] THEORY AND EXPERIMENTS ON SHOT NOISE IN SEMICONDUCTOR JUNCTION DIODES AND TRANSISTORS [J]. PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1957, 45 (06): : 839 - 854