A DEEP LEVEL TRANSIENT SPECTROSCOPY SYSTEM USING SINGLE-GATED SIGNAL AVERAGER

被引:3
作者
ATANASOV, RD [1 ]
机构
[1] TOKYO INST TECHNOL,GRAD SCH SCI & TECHNOL,MIDORI KU,YOKOHAMA,KANAGAWA 227,JAPAN
关键词
D O I
10.1063/1.1136391
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:1277 / 1279
页数:3
相关论文
共 3 条
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[3]   DEEP-LEVEL TRANSIENT SPECTROSCOPY - NEW METHOD TO CHARACTERIZE TRAPS IN SEMICONDUCTORS [J].
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