SURFACE NUCLEATED CRYSTALLIZATION IN GE15TE80AS5 SEMICONDUCTING GLASSES

被引：3

作者：

JOHNSON, RT ^{[1
]}

QUINN, RK ^{[1
]}

MIGLIONICO, CJ ^{[1
]}

机构：

[1] SANDIA LABS, ALBUQUERQUE, NM 87115 USA

来源：

关键词：

D O I：

10.1016/0025-5408(74)90137-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：667 / 677

页数：11

共 21 条

[1] Adler D., 1970, Journal of Non-Crystalline Solids, V4, P330, DOI 10.1016/0022-3093(70)90059-1
[2] BRADLEY DE, 1967, TECHNIQUES ELECTRON
[3] CHAUDHARI P, 1972, J NONCRYST SOLIDS, V8, P900
[4] Chaudhari P., 1972, J NONCRYST SOLIDS, V8-10, P56
[5] READOUT SENSITIVITY OF AN AMORPHOUS SEMICONDUCTOR ELECTRON-BEAM MEMORY
CHEN, ACM
DUNHAM, AM
WANG, JM
[J]. JOURNAL OF APPLIED PHYSICS, 1973, 44 (04) : 1936 - 1937
[6] Evans E. J., 1970, Journal of Non-Crystalline Solids, V2, P334, DOI 10.1016/0022-3093(70)90149-3
[7] Fritzsche H., 1970, Journal of Non-Crystalline Solids, V2, P148, DOI 10.1016/0022-3093(70)90130-4
[8] GUTFELD RJV, 1972, J APPL PHYS, V43, P4688
[9] THERMALLY INDUCED SURFACE AND BULK ELECTRICAL EFFECTS IN SEMICONDUCTING GE15TE80AS5 GLASSES
JOHNSON, RT
QUINN, RK
[J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (09) : 3875 - &
[10] THERMAL BEHAVIOR OF NONCRYSTALLINE SPUTTERED FILMS IN SYSTEM GE-TE
MESSIER, R
ROY, R
[J]. MATERIALS RESEARCH BULLETIN, 1971, 6 (08) : 749 - &