THE EFFECT OF DEFORMATION ON SELECTED AREA ELECTRON CHANNELING PATTERNS

被引：15

作者：

DAVIDSON, DL

机构：

来源：

关键词：

D O I：

10.1007/BF00727843

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：236 / 238

页数：3

共 6 条

[1]

BOOKER GR, 1973, SCANNING ELECTRON MI, P140

[2] FATIGUE CRACK TIP DISPLACEMENT OBSERVATIONS [J].

DAVIDSON, DL .

[3]

DAVIDSON DL, SCANNING ELECTRON MI

[4]

DAVIDSON DL, 1981, FATIGUE ENG MAT STRU, V3, P289

[5] INDENTATION PLASTICITY AND MICROFRACTURE IN SILICON-CARBIDE [J].

LANKFORD, J ;

DAVIDSON, DL .

[6] INTERPRETATION OF WIDTHS OF SEM ELECTRON CHANNELLING LINES [J].

SCHULSON, EM .

PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1971, 46 (01) :95-&