SLOW PHOTOCONDUCTIVE KINETICS IN CL-DOPED CDTE AND GA-DOPED CDTE

被引:17
作者
LOSEE, DL [1 ]
KHOSLA, RP [1 ]
RANADIVE, DK [1 ]
SMITH, FTJ [1 ]
机构
[1] EASTMAN KODAK CO,RES LABS,ROCHESTER,NY 14650
关键词
D O I
10.1016/0038-1098(73)90375-X
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
引用
收藏
页码:819 / 822
页数:4
相关论文
共 10 条
[1]   EFFECT OF TE AND S DONOR LEVELS ON PROPERTIES OF GAAS1-XPX NEAR DIRECT-INDIRECT TRANSITION [J].
CRAFORD, MG ;
STILLMAN, GE ;
ROSSI, JA ;
HOLONYAK, N .
PHYSICAL REVIEW, 1968, 168 (03) :867-&
[2]  
EERNISSE EP, 1973, SOLID STATE ELECTRON, V16, P315, DOI 10.1016/0038-1101(73)90004-X
[3]  
Frenkel J, 1938, PHYS REV, V54, P647, DOI 10.1103/PhysRev.54.647
[4]   NON-G DONOR LEVELS AND KINETICS OF ELECTRON-TRANSFER IN N-TYPE CDTE [J].
ISELER, GW ;
KAFALAS, JA ;
STRAUSS, AJ ;
BUBE, RH ;
MACMILLAN, HF .
SOLID STATE COMMUNICATIONS, 1972, 10 (07) :619-+
[6]   SOME PROPERTIES OF DOUBLE ACCEPTOR CENTER IN CDTE [J].
LORENZ, MR ;
WOODBURY, HH ;
SEGALL, B .
PHYSICAL REVIEW, 1964, 134 (3A) :A751-+
[7]  
LOSEE DL, TO BE PUBLISHED
[8]  
MACMILLAN HF, 1972, THESIS STANFORD U
[9]   THERMAL AND OPTICAL EMISSION AND CAPTURE RATES AND CROSS SECTIONS OF ELECTRONS AND HOLES AT IMPERFECTION CENTERS IN SEMICONDUCTORS FROM PHOTO AND DARK JUNCTION CURRENT AND CAPACITANCE EXPERIMENTS [J].
SAH, CT ;
FORBES, L ;
ROSIER, LL ;
TASCH, AF .
SOLID-STATE ELECTRONICS, 1970, 13 (06) :759-+
[10]  
SMITH FTJ, 1973, B AM PHYS SOC, V18, P325