共 9 条
- [1] BIEFELD RM, 1983, JUN EL MAT C BURL, P60
- [2] INTERFACIAL SHARPNESSES AND THICKNESSES OF LAYERS IN A GAAS0.2P0.8/GAP STRAINED-LAYER SUPERLATTICE MEASURED BY AUGER SPUTTER PROFILING [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (06): : 2596 - 2599
- [4] GOURLEY PL, UNPUB
- [5] GUENTHER KH, 1976, APPL OPTICS, V15, P2992, DOI 10.1364/AO.15.002992
- [6] MACLEOD HA, 1969, THIN FILM OPTICAL FI, pCH5
- [7] MATTHEWS JW, 1974, J CRYST GROWTH, V27, P118, DOI 10.1016/0022-0248(74)90424-2
- [8] OSBOURN GC, SEMICONDUCTORS SEMIM
- [9] PIKHTIN AN, 1980, SOV PHYS SEMICOND+, V14, P389