TUNGSTEN INTERCONNECTION LAYERS FORMED BY CHEMICAL VAPOR-DEPOSITION

被引:4
作者
HARA, T
CHEN, SC
ANDO, H
WU, HM
机构
关键词
D O I
10.1109/T-ED.1987.22984
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:715 / 716
页数:2
相关论文
共 8 条
[1]  
FUCHS C, 1986, TUNGSTEN OTHER REFRA, P257
[2]  
HARA T, 1984, JPN J APPL PHYS, V23, P455
[3]  
HARA T, 1986, J ELECTROCHEM SOC, V133
[4]  
Krisht M. H., 1986, Tungsten and Other Refractory Metals for VLSI Applications. Proceedings of the 1985 and 1984 Workshops, P313
[5]  
MILLER NE, 1980, SOLID STATE TECHNOL, V23, P79
[6]  
SACHDEV S, 1985, SEMICONDUCTOR INT, P306
[7]   EFFECT OF SCALING OF INTERCONNECTIONS ON THE TIME-DELAY OF VLSI CIRCUITS [J].
SARASWAT, KC ;
MOHAMMADI, F .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1982, 29 (04) :645-650
[8]   REFRACTORY-METAL GATE PROCESSES FOR VLSI APPLICATIONS [J].
SHAH, PL .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (04) :631-640