MEASUREMENT OF SINGLE-CRYSTAL LATTICE-PARAMETERS USING A DOUBLE-DIFFRACTION TECHNIQUE

被引:17
作者
SPOONER, FJ [1 ]
WILSON, CG [1 ]
机构
[1] ROY MIL COLL SCI,PHYS BRANCH,SWINDON,WILTSHIRE,ENGLAND
关键词
D O I
10.1107/S0021889873008290
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
引用
收藏
页码:132 / 135
页数:4
相关论文
共 2 条
[1]   X-RAY WAVELENGTHS [J].
BEARDEN, JA .
REVIEWS OF MODERN PHYSICS, 1967, 39 (01) :78-&
[2]   GEOMETRY OF X-RAY MULTIPLE DIFFRACTION IN CRYSTALS [J].
ISHERWOOD, BJ ;
WALLACE, CA .
ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1971, A 27 (MAR1) :119-+