GEOMETRY OF X-RAY MULTIPLE DIFFRACTION IN CRYSTALS

被引：23

作者：

ISHERWOOD, BJ

WALLACE, CA

机构：

来源：

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY | 1971年 / A 27卷 / MAR1期

关键词：

D O I：

10.1107/S0567739471000251

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：119 / +

页数：1

共 21 条

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[2]

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[4] ELIMINATION OF MULTIPLE REFLECTION ON 4-CIRCLE DIFFRACTOMETER [J].

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ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 :253-&

[5]

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[6]

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EWALD, PP ;

HENO, Y .

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 :5-&

[8] PRECISION DETERMINATION OF LATTICE CONSTANT BY KOSSEL LINE TECHNIQUE [J].

HEISE, BH .

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[9] MEASUREMENT OF LATTICE PARAMETER OF SILICON USING A DOUBLE-DIFFRACTION EFFECT [J].

ISHERWOOD, BJ ;

WALLACE, CA .

NATURE, 1966, 212 (5058) :173-+

[10] AN X-RAY MULTIPLE DIFFRACTION STUDY OF YTTRIUM IRON GARNET CRYSTALS [J].

ISHERWOOD, BJ .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1968, 1 :299-+

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