PIEZORESISTANCE IN POLYCRYSTALLINE GERMANIUM FILMS

被引：7

作者：

DEVENYI, A

BELU, A

SLADARU, S

机构：

[1] Institute of Physics of the Academy, Bucharest

来源：

THIN SOLID FILMS | 1969年 / 4卷 / 03期

关键词：

D O I：

10.1016/0040-6090(69)90037-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Piezoresistive measurements have been performed on polycrystalline germanium films with different mean crystallite sizes in the temperature range from 115° to 625°K. The results are consistent with a structural model where the crystallites are supposed to be separated by thin layers of disordered material about 10 Å thick. Comparison of these results with those obtained on amorphous Ge films contradict sharply the concept of amorphous Ge being a microcrystalline material. © 1969.

引用

页码：211 / &

共 14 条

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