SCANNING TUNNELING MICROSCOPY AND ATOMIC FORCE MICROSCOPY IN THE CHARACTERIZATION OF ACTIVATED GRAPHITE-ELECTRODES

被引：39

作者：

FREUND, MS

BRAJTERTOTH, A

COTTON, TM

HENDERSON, ER

机构：

[1] UNIV FLORIDA,DEPT CHEM,GAINESVILLE,FL 32611

[2] IOWA STATE UNIV SCI & TECHNOL,DEPT CHEM,AMES,IA 50011

[3] IOWA STATE UNIV SCI & TECHNOL,DEPT ZOOL & GENET,AMES,IA 50011

来源：

ANALYTICAL CHEMISTRY | 1991年 / 63卷 / 10期

关键词：

D O I：

10.1021/ac00010a023

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

[No abstract available]

引用

页码：1047 / 1049

页数：3

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