ACCUMULATION OF DEFECTS IN SILICON AT SUPERHIGH DOSES OF ELECTRON-IRRADIATION

被引:8
作者
AKHMETOV, VD
BOLOTOV, VV
DVURECHENSKY, AV
KASHNIKOV, BP
SMIRNOV, LS
TISHKOVSKY, EG
机构
来源
RADIATION EFFECTS AND DEFECTS IN SOLIDS | 1980年 / 53卷 / 1-2期
关键词
Compendex;
D O I
10.1080/00337578008207093
中图分类号
TL [原子能技术]; O571 [原子核物理学];
学科分类号
0827 ; 082701 ;
摘要
SEMICONDUCTING SILICON
引用
收藏
页码:33 / 39
页数:7
相关论文
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