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CURRENT COPIER CELLS
被引:116
作者
:
DAUBERT, SJ
论文数:
0
引用数:
0
h-index:
0
机构:
COLUMBIA UNIV,CTR TELECOMMUN RES,DEPT ELECT ENGN,NEW YORK,NY 10027
COLUMBIA UNIV,CTR TELECOMMUN RES,DEPT ELECT ENGN,NEW YORK,NY 10027
DAUBERT, SJ
[
1
]
VALLANCOURT, D
论文数:
0
引用数:
0
h-index:
0
机构:
COLUMBIA UNIV,CTR TELECOMMUN RES,DEPT ELECT ENGN,NEW YORK,NY 10027
COLUMBIA UNIV,CTR TELECOMMUN RES,DEPT ELECT ENGN,NEW YORK,NY 10027
VALLANCOURT, D
[
1
]
TSIVIDIS, YP
论文数:
0
引用数:
0
h-index:
0
机构:
COLUMBIA UNIV,CTR TELECOMMUN RES,DEPT ELECT ENGN,NEW YORK,NY 10027
COLUMBIA UNIV,CTR TELECOMMUN RES,DEPT ELECT ENGN,NEW YORK,NY 10027
TSIVIDIS, YP
[
1
]
机构
:
[1]
COLUMBIA UNIV,CTR TELECOMMUN RES,DEPT ELECT ENGN,NEW YORK,NY 10027
来源
:
ELECTRONICS LETTERS
|
1988年
/ 24卷
/ 25期
关键词
:
Integrated Circuits;
D O I
:
10.1049/el:19881064
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
Analog circuits are presented that can sample, hold, and make practically identical multiple copies of current signals without the need for accurate matching of active or passive circuit components.
引用
收藏
页码:1560 / 1562
页数:3
相关论文
共 4 条
[1]
LIE HP, 1986, Patent No. 4585956
[2]
DEVICE, CIRCUIT, AND TECHNOLOGY SCALING TO MICRON AND SUB-MICRON DIMENSIONS
REISMAN, A
论文数:
0
引用数:
0
h-index:
0
机构:
N CAROLINA STATE UNIV,DEPT ELECT ENGN,RALEIGH,NC 27650
REISMAN, A
[J].
PROCEEDINGS OF THE IEEE,
1983,
71
(05)
: 550
-
565
[3]
VALLANCOURT D, THESIS COLUMBIA U NE
[4]
MEASUREMENT AND MODELING OF CHARGE FEEDTHROUGH IN N-CHANNEL MOS ANALOG SWITCHES
WILSON, WB
论文数:
0
引用数:
0
h-index:
0
机构:
AT&T BELL LABS,TECH STAFF,READING,PA 19604
AT&T BELL LABS,TECH STAFF,READING,PA 19604
WILSON, WB
MASSOUD, HZ
论文数:
0
引用数:
0
h-index:
0
机构:
AT&T BELL LABS,TECH STAFF,READING,PA 19604
AT&T BELL LABS,TECH STAFF,READING,PA 19604
MASSOUD, HZ
SWANSON, EJ
论文数:
0
引用数:
0
h-index:
0
机构:
AT&T BELL LABS,TECH STAFF,READING,PA 19604
AT&T BELL LABS,TECH STAFF,READING,PA 19604
SWANSON, EJ
GEORGE, RT
论文数:
0
引用数:
0
h-index:
0
机构:
AT&T BELL LABS,TECH STAFF,READING,PA 19604
AT&T BELL LABS,TECH STAFF,READING,PA 19604
GEORGE, RT
FAIR, RB
论文数:
0
引用数:
0
h-index:
0
机构:
AT&T BELL LABS,TECH STAFF,READING,PA 19604
AT&T BELL LABS,TECH STAFF,READING,PA 19604
FAIR, RB
[J].
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1985,
20
(06)
: 1206
-
1213
←
1
→
共 4 条
[1]
LIE HP, 1986, Patent No. 4585956
[2]
DEVICE, CIRCUIT, AND TECHNOLOGY SCALING TO MICRON AND SUB-MICRON DIMENSIONS
REISMAN, A
论文数:
0
引用数:
0
h-index:
0
机构:
N CAROLINA STATE UNIV,DEPT ELECT ENGN,RALEIGH,NC 27650
REISMAN, A
[J].
PROCEEDINGS OF THE IEEE,
1983,
71
(05)
: 550
-
565
[3]
VALLANCOURT D, THESIS COLUMBIA U NE
[4]
MEASUREMENT AND MODELING OF CHARGE FEEDTHROUGH IN N-CHANNEL MOS ANALOG SWITCHES
WILSON, WB
论文数:
0
引用数:
0
h-index:
0
机构:
AT&T BELL LABS,TECH STAFF,READING,PA 19604
AT&T BELL LABS,TECH STAFF,READING,PA 19604
WILSON, WB
MASSOUD, HZ
论文数:
0
引用数:
0
h-index:
0
机构:
AT&T BELL LABS,TECH STAFF,READING,PA 19604
AT&T BELL LABS,TECH STAFF,READING,PA 19604
MASSOUD, HZ
SWANSON, EJ
论文数:
0
引用数:
0
h-index:
0
机构:
AT&T BELL LABS,TECH STAFF,READING,PA 19604
AT&T BELL LABS,TECH STAFF,READING,PA 19604
SWANSON, EJ
GEORGE, RT
论文数:
0
引用数:
0
h-index:
0
机构:
AT&T BELL LABS,TECH STAFF,READING,PA 19604
AT&T BELL LABS,TECH STAFF,READING,PA 19604
GEORGE, RT
FAIR, RB
论文数:
0
引用数:
0
h-index:
0
机构:
AT&T BELL LABS,TECH STAFF,READING,PA 19604
AT&T BELL LABS,TECH STAFF,READING,PA 19604
FAIR, RB
[J].
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1985,
20
(06)
: 1206
-
1213
←
1
→