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ANGLE-RESOLVED PHOTOEMISSION-STUDIES OF THE BAND-STRUCTURE OF TISE2 AND TIS2

被引：156
作者：
CHEN, CH
FABIAN, W
BROWN, FC
WOO, KC
DAVIES, B
DELONG, B
THOMPSON, AH
机构：
[1] UNIV ILLINOIS,DEPT PHYS,URBANA,IL 61801
[2] UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801
[3] EXXON CHEM CO,LINDEN,NJ 07036
来源：
PHYSICAL REVIEW B | 1980年 / 21卷 / 02期
关键词：
D O I：
10.1103/PhysRevB.21.615
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：615 / 624
页数：10
相关论文
共 29 条
  • [1] ANGLE-RESOLVED PHOTOEMISSION FROM TISE2 USING SYNCHROTRON RADIATION
    BACHRACH, RZ
    SKIBOWSKI, M
    BROWN, FC
    [J]. PHYSICAL REVIEW LETTERS, 1976, 37 (01) : 40 - 42
  • [2] PHOTOELECTRON-SPECTROSCOPY BY TIME-OF-FLIGHT TECHNIQUE USING SYNCHROTRON RADIATION
    BACHRACH, RZ
    BROWN, FC
    HAGSTROM, SBM
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01): : 309 - 312
  • [3] BRODEN G, 1970, G1PR055 CHALM U TECH
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    [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1978, 11 (22): : 4501 - 4514
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    [J]. ADVANCES IN PHYSICS, 1977, 26 (06) : 847 - 885
  • [6] ELECTRONIC PROPERTIES AND SUPERLATTICE FORMATION IN SEMIMETAL TISE2
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    MONCTON, DE
    WASZCZAK, JV
    [J]. PHYSICAL REVIEW B, 1976, 14 (10): : 4321 - 4328
  • [7] SEMIMETALLIC CHARACTER OF TISE2 AND SEMICONDUCTOR CHARACTER OF TIS2 UNDER PRESSURE
    FRIEND, RH
    JEROME, D
    LIANG, WY
    MIKKELSEN, JC
    YOFFE, AD
    [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1977, 10 (24): : L705 - L708
  • [8] STRUCTURAL DISTORTION IN TISE2 AND RELATED MATERIALS - POSSIBLE JAHN-TELLER EFFECT
    HUGHES, HP
    [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1977, 10 (11): : L319 - L323
  • [9] SELF-CONSISTENT ELECTRONIC-SPECTRUM OF LAYER CRYSTAL TIS2
    KRUSIUS, P
    BOEHM, JV
    ISOMAKI, H
    [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1975, 8 (22): : 3788 - 3800
  • [10] ELECTRON-HOLE SCATTERING AND ELECTRICAL-RESISTIVITY OF SEMIMETAL TIS2
    KUKKONEN, CA
    MALDAGUE, PF
    [J]. PHYSICAL REVIEW LETTERS, 1976, 37 (12) : 782 - 785
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