TARGET CHAMBER FOR CHARGED-PARTICLE INDUCED X-RAY-FLUORESCENCE STUDIES

[1] CAHILL TA, 1971, B AM PHYS SOC, V16, P545

[2] TECHNIQUE FOR DETERMINATION OF HEAVY ELEMENT IMPURITIES IN TARGETS [J]. NUCLEAR INSTRUMENTS & METHODS, 1971, 97 (03): : 607 - &

[3] DARDIS TA, 1971, B AM PHYS SOC, V16, P1171

[4] SENSITIVITY VERSUS TARGET BACKINGS FOR ELEMENTAL ANALYSIS BY ALPHA EXCITED X-RAY-EMISSION [J]. NUCLEAR INSTRUMENTS & METHODS, 1972, 100 (03): : 397 - +

[5] X-RAY ANALYSIS - ELEMENTAL TRACE ANALYSIS AT 10-12G LEVEL [J]. NUCLEAR INSTRUMENTS & METHODS, 1970, 84 (01): : 141 - +

[6] KRAUSHAAR JJ, 1971, B AM PHYS SOC, V16, P545

[7] MARION JB, 1968, NUCLEAR REACTION ANA, P136

[8] PERRY S, 1972, B AM PHYS SOC, V17, P120

[9] UMBARGER CJ, 1972, B AM PHYS SOC, V17, P88

[10] INVESTIGATION OF ANALYTICAL CAPABILITIES OF X-RAY EMISSION INDUCED BY HIGH ENERGY ALPHA PARTICLES [J]. NUCLEAR INSTRUMENTS & METHODS, 1971, 93 (01): : 69 - &

[1] CAHILL TA, 1971, B AM PHYS SOC, V16, P545

[2] TECHNIQUE FOR DETERMINATION OF HEAVY ELEMENT IMPURITIES IN TARGETS [J]. NUCLEAR INSTRUMENTS & METHODS, 1971, 97 (03): : 607 - &

[3] DARDIS TA, 1971, B AM PHYS SOC, V16, P1171

[4] SENSITIVITY VERSUS TARGET BACKINGS FOR ELEMENTAL ANALYSIS BY ALPHA EXCITED X-RAY-EMISSION [J]. NUCLEAR INSTRUMENTS & METHODS, 1972, 100 (03): : 397 - +

[5] X-RAY ANALYSIS - ELEMENTAL TRACE ANALYSIS AT 10-12G LEVEL [J]. NUCLEAR INSTRUMENTS & METHODS, 1970, 84 (01): : 141 - +

[6] KRAUSHAAR JJ, 1971, B AM PHYS SOC, V16, P545

[7] MARION JB, 1968, NUCLEAR REACTION ANA, P136

[8] PERRY S, 1972, B AM PHYS SOC, V17, P120

[9] UMBARGER CJ, 1972, B AM PHYS SOC, V17, P88

[10] INVESTIGATION OF ANALYTICAL CAPABILITIES OF X-RAY EMISSION INDUCED BY HIGH ENERGY ALPHA PARTICLES [J]. NUCLEAR INSTRUMENTS & METHODS, 1971, 93 (01): : 69 - &