PROTON-INDUCED X-RAY-EMISSION (PIXE) - NEW TOOL IN GEOCHEMISTRY

被引：21

作者：

KULLERUD, G ^{[1
]}

STEFFEN, RM ^{[1
]}

SIMMS, PC ^{[1
]}

RICKEY, FA ^{[1
]}

机构：

[1] PURDUE UNIV, DEPT PHYS, W LAFAYETTE, IN 47907 USA

来源：

CHEMICAL GEOLOGY | 1979年 / 25卷 / 03期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0009-2541(79)90145-1

中图分类号：

P3 [地球物理学]; P59 [地球化学];

学科分类号：

0708 ; 070902 ;

摘要：

A proton induced X-ray emission (PIXE) method has been developed for determination of the concentrations of elements (with Z > 12) in geological samples. In this procedure proton bombardment is utilized to induce characteristic X-rays in all elements present in samples to be analyzed. The method involves observation and counting of these X-rays thereby providing a quantitative measurement of the concentration of each element (with Z > 12) in the samples. Complete analysis can be obtained in about 30 min, only mg amounts of material are required, samples are not destroyed, the concentrations of as many as 75 elements are obtained in one operation and the procedure is fully automated. Concentrations of a few ppm, in some favorable cases 1 ppb, can be quantitatively determined. Advantages and limitations of the method are discussed. © 1979.

引用

页码：245 / 256

页数：12

共 15 条

[1] PROTON MICROPROBE - POWERFUL TOOL FOR NONDESTRUCTIVE TRACE-ELEMENT ANALYSIS [J].