2.51 EV PHOTOLUMINESCENCE FROM ZN-DOPED CUALSE2 EPILAYERS GROWN BY LOW-PRESSURE METALORGANIC CHEMICAL-VAPOR-DEPOSITION

被引:14
作者
CHICHIBU, S
MATSUMOTO, S
SHIRAKATA, S
ISOMURA, S
HIGUCHI, H
机构
[1] EHIME UNIV,FAC ENGN,MATSUYAMA,EHIME 790,JAPAN
[2] BENTEC CORP,TACHIKAWA,TOKYO 190,JAPAN
关键词
D O I
10.1063/1.109054
中图分类号
O59 [应用物理学];
学科分类号
摘要
A photoluminescence (PL) peak at 2.51 eV was observed at 77 K in Zn-doped CuAlSe2 chalcopyrite semiconductor epilayers grown by a low-pressure metalorganic chemical vapor deposition. The emission can be seen as blue-green. The PL peak at 2.51 eV was absent in Al-rich epilayers. Photoreflectance measurements were performed on both undoped and Zn-doped CuAlSe2 epilayers. Zn doping up to the level of 0.02 at. % did not affect the valence band profile.
引用
收藏
页码:3306 / 3308
页数:3
相关论文
共 19 条
[1]   VISIBLE PHOTOLUMINESCENCE OF ZN-DOPED CUALS2 [J].
AKSENOV, I ;
SATO, K .
APPLIED PHYSICS LETTERS, 1992, 61 (09) :1063-1065
[2]  
AKSENOV IA, 1989, PHYS STATUS SOLIDI A, V15, pK113
[3]  
Aspnes D. E., 1980, HDB SEMICONDUCTORS, V2
[4]   THIRD-DERIVATIVE MODULATION SPECTROSCOPY WITH LOW-FIELD ELECTROREFLECTANCE [J].
ASPNES, DE .
SURFACE SCIENCE, 1973, 37 (01) :418-442
[5]   REFLECTION MEASUREMENTS WITH POLARIZATION MODULATION - METHOD TO INVESTIGATE BANDGAPS IN BIREFRINGENT MATERIALS LIKE I-III-VI2 CHALCOPYRITE COMPOUNDS [J].
BETTINI, M .
SOLID STATE COMMUNICATIONS, 1973, 13 (05) :599-602
[6]   ELECTRICAL AND OPTICAL-PROPERTIES OF CUALSE2 GROWN BY IODINE CHEMICAL VAPOR TRANSPORT [J].
CHICHIBU, S ;
SHISHIKURA, M ;
INO, J ;
MATSUMOTO, S .
JOURNAL OF APPLIED PHYSICS, 1991, 70 (03) :1648-1655
[7]   LP-MOCVD GROWTH OF CUALSE2 EPITAXIAL LAYERS [J].
CHICHIBU, S ;
IWAI, A ;
MATSUMOTO, S ;
HIGUCHI, H .
JOURNAL OF CRYSTAL GROWTH, 1993, 126 (04) :635-642
[8]  
CHICHIBU S, IN PRESS J CRYST GRO
[9]   CRYSTALLIZATION OF CUGAS2 FROM PB AND SN SOLUTIONS [J].
HOBLER, HJ ;
KUHN, G ;
TEMPEL, A .
JOURNAL OF CRYSTAL GROWTH, 1981, 53 (03) :451-457
[10]   LUMINESCENCE OF CUGAS2 [J].
MASSE, G .
JOURNAL OF APPLIED PHYSICS, 1985, 58 (02) :930-935