AN ULTRA-LOW-LOAD PENETRATION HARDNESS TESTER

被引：170

作者：

NEWEY, D ^{[1
]}

WILKINS, MA ^{[1
]}

POLLOCK, HM ^{[1
]}

机构：

[1] AERE,HARWELL OX11 0RA,OXFORDSHIRE,ENGLAND

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1982年 / 15卷 / 01期

关键词：

D O I：

10.1088/0022-3735/15/1/023

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：119 / 122

页数：4

共 12 条

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[2] Berkovich E. S., 1951, IND DIAMOND REV, V11, P129
[3] Buckle H., 1973, SCI HARDNESS TESTING, P453
[4] FROLICH F, 1977, PHYS STATUS SOLIDI A, V42, P79
[5] GRODZINSKI P, 1953, PLASTICS, V18, P312
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HARTLEY, NEW
[J]. THIN SOLID FILMS, 1979, 64 (02) : 177 - 190
[7] SURFACE HARDENING OF BERYLLIUM BY ION-IMPLANTATION
KANT, RA
HIRVONEN, JK
KNUDSON, AR
WOLLAM, JS
[J]. THIN SOLID FILMS, 1979, 63 (01) : 27 - 30
[8] Mott B.W., 1956, MICROINDENTATION HAR
[9] NEWEY D, 1982, JUN P C MOD SURF PRO
[10] ULTRA-MICROHARDNESS OF VACUUM-DEPOSITED FILMS .1. ULTRA-MICROHARDNESS TESTER
NISHIBORI, M
KINOSITA, K
[J]. THIN SOLID FILMS, 1978, 48 (03) : 325 - 331