NEW METHOD FOR FOCUSING X-RAYS AND GAMMA-RAYS

[21] COMPARISON OF SYNCHROTRON AND LABORATORY DISCHARGE LIGHT-SOURCES [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1978, 68 (09) : 1181 - 1183

[22] ROSE D, 1956, ANL5642 REP

[23] NEW CLASS OF LAYERED MATERIALS [J]. PHYSICAL REVIEW LETTERS, 1980, 44 (24) : 1597 - 1600

[24] USE OF CRYSTAL DIFFRACTION WITH GE DIODE DETECTOR FOR HIGH RESOLUTION GAMMA-RAY SPECTROSCOPY [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1967, 38 (01) : 52 - &

[25] WEISSKOPT M, 1980, DEC UH MEM S GODD SP

[26] CONICAL FOCUSING CRYSTAL SPECTROMETERS FOR COSMIC X-RAY ASTRONOMY [J]. APPLIED OPTICS, 1973, 12 (11) : 2759 - 2764

[27] 1981, APR APS M BALT

[28] 1980, 10TH S REL ASTR BALT

[21] COMPARISON OF SYNCHROTRON AND LABORATORY DISCHARGE LIGHT-SOURCES [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1978, 68 (09) : 1181 - 1183

[22] ROSE D, 1956, ANL5642 REP

[23] NEW CLASS OF LAYERED MATERIALS [J]. PHYSICAL REVIEW LETTERS, 1980, 44 (24) : 1597 - 1600

[24] USE OF CRYSTAL DIFFRACTION WITH GE DIODE DETECTOR FOR HIGH RESOLUTION GAMMA-RAY SPECTROSCOPY [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1967, 38 (01) : 52 - &

[25] WEISSKOPT M, 1980, DEC UH MEM S GODD SP

[26] CONICAL FOCUSING CRYSTAL SPECTROMETERS FOR COSMIC X-RAY ASTRONOMY [J]. APPLIED OPTICS, 1973, 12 (11) : 2759 - 2764

[27] 1981, APR APS M BALT

[28] 1980, 10TH S REL ASTR BALT