COMPARISON OF BASIC PRINCIPLES OF THE SURFACE-SPECIFIC ANALYTICAL METHODS - AES/SAM, ESCA (XPS), SIMS, AND ISS WITH X-RAY-MICROANALYSIS, AND SOME APPLICATIONS IN RESEARCH AND INDUSTRY

被引：41

作者：

HANTSCHE, H

机构：

来源：

关键词：

D O I：

10.1002/sca.4950110602

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：257 / 280

页数：24

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