EFFECT OF LUBRICANT ENVIRONMENTS ON SAW DAMAGE IN SI WAFERS

被引:12
作者
KUAN, TS [1 ]
SHIH, KK [1 ]
VANVECHTEN, JA [1 ]
WESTDORP, WA [1 ]
机构
[1] IBM CORP,E FISHKILL FACIL,DIV DATA SYST,HOPEWELL JUNCTION,NY 12533
关键词
D O I
10.1149/1.2129904
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
引用
收藏
页码:1387 / 1394
页数:8
相关论文
共 25 条
  • [1] ON A NEW MODE OF DEFORMATION IN INDIUM ANTIMONIDE
    ALLEN, JW
    [J]. PHILOSOPHICAL MAGAZINE, 1959, 4 (45): : 1046 - 1054
  • [2] BUCK TM, 1960, SURFACE CHEMISTRY ME, P107
  • [3] BUCK TM, 1970, SILICON DEVICE PROCE, P419
  • [4] FAUST JW, 1964, ELECTROCHEM TECHNOL, V2, P339
  • [5] SHOCK-WAVE COMPRESSION OF GERMANIUM FROM 20 TO 140 KBAR
    GRAHAM, RA
    JONES, OE
    HOLLAND, JR
    [J]. JOURNAL OF APPLIED PHYSICS, 1965, 36 (12) : 3955 - &
  • [6] PHASE-TRANSITION IN DIAMOND-STRUCTURE CRYSTALS DURING HARDNESS MEASUREMENTS
    GRIDNEVA, IV
    MILMAN, YV
    TREFILOV, VI
    [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1972, 14 (01): : 177 - 182
  • [7] KINK FORMATION IN CHARGED DISLOCATION
    HAASEN, P
    [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1975, 28 (01): : 145 - 155
  • [8] DEFORMATION OF SILICON AT LOW-TEMPERATURES
    HILL, MJ
    ROWCLIFFE, DJ
    [J]. JOURNAL OF MATERIALS SCIENCE, 1974, 9 (10) : 1569 - 1576
  • [9] HOWARD JK, 1968, TR22714 IBM
  • [10] IRISH TH, 1975, TR221933 IBM