EVALUATION OF GEOMETRICAL EFFECTS IN 4 POINT PROBE MEASUREMENTS

[1] MAGNETOCONDUCTIVE CORRECTION FACTORS FOR AN ISOTROPIC HALL PLATE WITH POINT SOURCES [J]. SOLID-STATE ELECTRONICS, 1966, 9 (05) : 395 - &

[2] CARSON CT, 1966, IEEE T MTT, VMT14, P497

[3] CHAWLA BR, 1970, IEEE T ELECTRON DEVI, VED17, P915

[4] Forsythe G. E., 1960, FINITE DIFFERENCE ME

[5] GREEN MA, 1969, THESIS U QUEENSLAND

[6] Hansen E.B., 1960, APPL SCI RES, V8, P93

[7] SHEET RESISTIVITY MEASUREMENTS ON RECTANGULAR SURFACES-GENERAL SOLUTION FOR 4 POINT PROBE CONVERSION FACTORS [J]. BELL SYSTEM TECHNICAL JOURNAL, 1967, 46 (10): : 2277 - +

[8] SEMICONDUCTOR SHEET RESISTIVITY MEASUREMENTS ON SQUARE SAMPLES [J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1964, 41 (11): : 679 - &

[9] SINNOT DH, 1969, IEEE MICR T, VMT17, P20

[10] MEASUREMENT OF SHEET RESISTIVITIES WITH THE 4-POINT PROBE [J]. BELL SYSTEM TECHNICAL JOURNAL, 1958, 37 (03): : 711 - 718

[1] MAGNETOCONDUCTIVE CORRECTION FACTORS FOR AN ISOTROPIC HALL PLATE WITH POINT SOURCES [J]. SOLID-STATE ELECTRONICS, 1966, 9 (05) : 395 - &

[2] CARSON CT, 1966, IEEE T MTT, VMT14, P497

[3] CHAWLA BR, 1970, IEEE T ELECTRON DEVI, VED17, P915

[4] Forsythe G. E., 1960, FINITE DIFFERENCE ME

[5] GREEN MA, 1969, THESIS U QUEENSLAND

[6] Hansen E.B., 1960, APPL SCI RES, V8, P93

[7] SHEET RESISTIVITY MEASUREMENTS ON RECTANGULAR SURFACES-GENERAL SOLUTION FOR 4 POINT PROBE CONVERSION FACTORS [J]. BELL SYSTEM TECHNICAL JOURNAL, 1967, 46 (10): : 2277 - +

[8] SEMICONDUCTOR SHEET RESISTIVITY MEASUREMENTS ON SQUARE SAMPLES [J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1964, 41 (11): : 679 - &

[9] SINNOT DH, 1969, IEEE MICR T, VMT17, P20

[10] MEASUREMENT OF SHEET RESISTIVITIES WITH THE 4-POINT PROBE [J]. BELL SYSTEM TECHNICAL JOURNAL, 1958, 37 (03): : 711 - 718