SURFACE-FILM X-RAY-MICROANALYSIS

被引：91

作者：

POUCHOU, JL

PICHOIR, F

机构：

[1] Office National d'Etudes et de Recherches Aérospatiales, Chatillon

来源：

SCANNING | 1990年 / 12卷 / 04期

关键词：

D O I：

10.1002/sca.4950120407

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

[No abstract available]

引用

页码：212 / 224

页数：13

共 29 条

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CASTAING, R ;

DESCAMPS, J .

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[3]

Castaing R., 1951, THESIS U PARIS

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DAVIS, CD .

BRITISH JOURNAL OF APPLIED PHYSICS, 1963, 14 (11) :813-&

[5]

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[6] CHARACTERISTIC FLUORESCENCE CORRECTION FOR ELECTRON-PROBE MICROANALYSIS OF THIN COATINGS [J].

COX, MGC ;

LOVE, G ;

SCOTT, VD .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1979, 12 (09) :1441-1451

[7]

DAGUET C, 1981, J MICROSC SPECT ELEC, V6, P77

[8]

Heinrich K., 1987, 11TH P INT C XRAY OP, P67

[9]

HEINRICH KFJ, 1981, ELECTRON BEAM XRAY A, P249

[10]

HUTCHINS GA, 1966, ELECTRON MICROPROBE, P390

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