EVALUATION OF SINGLE-CRYSTAL X-RAY-DIFFRACTION DATA FROM A POSITION-SENSITIVE DETECTOR

被引：1808

作者：

KABSCH, W

机构：

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1988年 / 21卷 / 06期

关键词：

Crystal rotations - Electronic pictures - Initialization step - Position-Sensitive Detectors - Single crystal diffraction data - Single crystal x-ray diffraction - Three-dimensional profiles - X-ray wavelengths;

D O I：

10.1107/S0021889888007903

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：916 / 924

页数：9

共 19 条

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